FN Thomson Reuters Web of Science™
VR 1.0
PT J
AU Schauries, D.
   Ney, V.
   Nayak, S. K.
   Entel, P.
   Guda, A. A.
   Soldatov, A. V.
   Wilhelm, F.
   Rogalev, A.
   Kummer, K.
   Yakhou, F.
   Ney, A.
TI Incorporation of nitrogen in Co:ZnO studied by x-ray absorption
   spectroscopy and x-ray linear dichroism
SO PHYSICAL REVIEW B
VL 87
IS 12
AR 125206
DI 10.1103/PhysRevB.87.125206
PD MAR 25 2013
PY 2013
AB N-doped CoxZn1-xO epitaxial films were grown by reactive magnetron
   sputtering using a range of different N-2 and O-2 concentrations. They
   were studied by x-ray absorption near edge spectroscopy (XANES) and
   x-ray linear dichroism (XLD). The incorporation of N into the ZnO host
   lattice could be determined via the XLD at the N K-edge in comparison
   with the O K-edge and respective simulations of XANES and XLD of the
   various dopant configurations. The addition of nitrogen predominantly
   leads to the formation of molecular nitrogen on O sites (split
   interstitial). Only for samples grown with very low O-2 partial pressure
   was a small fraction of the N found to substitute for O in its atomic
   form. DOI: 10.1103/PhysRevB.87.125206
RI Guda, Alexander/A-3671-2015; Ney, Andreas/D-2771-2013; Soldatov, Alexander/E-9323-2012
OI Guda, Alexander/0000-0002-6941-4987; Ney, Andreas/0000-0002-2388-6006;
   Soldatov, Alexander/0000-0001-8411-0546
ZB 0
ZR 0
ZS 0
Z8 1
TC 7
Z9 7
SN 1098-0121
EI 1550-235X
UT WOS:000316670600008
ER

EF